Constructs a u chart from defect counts and a per-observation
"exposure" (inspection size: square metres of fabric, hours of
operation, lines of code, etc.). For constant exposure use
shewhart_c().
Arguments
- data
A data frame.
- defects
Tidy-eval column reference for raw defect counts.
- exposure
Tidy-eval column reference for the inspection size (must be positive).
- index
Optional tidy-eval column reference for the x-axis.
- limits
One of
"3sigma"(default; classical normal approximation) or"poisson"(exact Poisson 0.00135 / 0.99865 quantiles, recommended whenc_bar < 10).- rules
Character vector of rule keys to apply. See
shewhart_rules_available(). Default applies Nelson 1 and 2.- locale
One of
"en","pt","es","fr". Affects plot labels and informative messages.- verbose
Logical. Print progress messages? Defaults to the
shewhart.verboseoption.
Value
A shewhart_chart object of subclass shewhart_u.
References
Montgomery, D. C. (2019). Introduction to Statistical Quality Control (8th ed.). Wiley. Chapter 7.3.2.
Examples
set.seed(1)
df <- data.frame(
roll = 1:25,
defects = rpois(25, lambda = 4 * runif(25, 0.5, 1.5)),
m2 = runif(25, 0.5, 1.5) # variable inspection size
)
fit <- shewhart_u(df, defects = defects, exposure = m2, index = roll)